Open Access Paper
30 April 2022 Front Matter: Volume 12177
Proceedings Volume 12177, International Workshop on Advanced Imaging Technology (IWAIT) 2022; 1217701 (2022) https://doi.org/10.1117/12.2638154
Event: International Workshop on Advanced Imaging Technology 2022 (IWAIT 2022), 2022, Hong Kong, China
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 12177, including the Title Page, Copyright information, Table of Contents, and Conference Committee list.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in International Workshop on Advanced Imaging Technology (IWAIT) 2022, edited by Masayuki Nakajima, Shogo Muramatsu, Jae-Gon Kim, Jing-Ming Guo, Qian Kemao, Proc. of SPIE 12177, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510653313

ISBN: 9781510653320 (electronic)

Published by

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Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE).

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher.

Printed in the United States of America by Curran Associates, Inc., under license from SPIE.

Publication of record for individual papers is online in the SPIE Digital Library.

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Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Honorary Chair

  • Wan-Chi Siu, The Hong Kong Polytechnic University (Hong Kong, China)

General Co-Chairs

  • Hiroyuki Arai, Yokohama National University (Japan)

  • Kosin Chamnongthai, King Mongkut’s University of Technology (Thailand)

  • Junyu Dong, Ocean University of China (China)

  • Jong-il Park, Hanyang University (Korea, Republic of)

  • Hitoshi Kiya, Tokyo Metropolitan University (Japan)

  • C. M. Pun, University of Macau (Macau, China)

Program Chair

  • Phooi Yee Lau, Universiti Tunku Abdul Rahman (UTAR) (Malaysia)

Program Co-Chairs

  • Daniel P.K. Lun, The Hong Kong Polytechnic University (Hong Kong, China)

  • Jing-Ming Guo, National Taiwan University of Science and Technology (Taiwan)

  • Yo-Sung Ho, Gwangju Institute of Science and Technology (Korea, Republic of)

  • Muwei Jian, Shandong University of Finance and Economics (China)

  • Jae-Gon Kim, Korea Aerospace University (Korea, Republic of)

  • Shogo Muramatsu, Niigata University (Japan)

  • Kemao Qian, Nanyang Technological University (Singapore)

© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 12177", Proc. SPIE 12177, International Workshop on Advanced Imaging Technology (IWAIT) 2022, 1217701 (30 April 2022); https://doi.org/10.1117/12.2638154
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