Measuring the x-ray flux from MEMS devices for timing applications

Donald A. Walko; Jinxing Jiang; Jian Zhou; Burak Guzelturk; Xiaoyi Zhang; David A. Czaplewski; Jin Wang

doi:10.1117/12.2633137

4 October 2022 Measuring the x-ray flux from MEMS devices for timing applications

Donald A. Walko, Jinxing Jiang, Jian Zhou, Burak Guzelturk, Xiaoyi Zhang, David A. Czaplewski, Jin Wang

Proceedings Volume 12240, Advances in X-Ray/EUV Optics and Components XVII; 1224009 (2022) https://doi.org/10.1117/12.2633137
Event: SPIE Optical Engineering + Applications, 2022, San Diego, California, United States

Abstract

Oscillating microelectromechanical systems (MEMS) devices can manipulate synchrotron x-ray beams at ultrafast rates. By selectively diffracting x-rays, these devices can “pick” or even “slice” x-ray pulses from a beam; diffractive time windows less than 1 ns have been demonstrated. Here we demonstrate the use of MEMS devices to produce modulated x-ray beams with a high x-ray throughput that modify the timing structure of a synchrotron beam, which can be applied to perform time-resolved x-ray diffraction experiments.

Conference Presentation

Citation Download Citation

Donald A. Walko, Jinxing Jiang, Jian Zhou, Burak Guzelturk, Xiaoyi Zhang, David A. Czaplewski, and Jin Wang "Measuring the x-ray flux from MEMS devices for timing applications", Proc. SPIE 12240, Advances in X-Ray/EUV Optics and Components XVII, 1224009 (4 October 2022); https://doi.org/10.1117/12.2633137

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