Presentation + Paper
1 December 2022 Characteristics of fine feature hole templates for nanoimprint lithography toward 2nm and beyond
Koji Ichimura, Koji Yoshida, Hideki Cho, Ryugo Hikichi, Masaaki Kurihara
Author Affiliations +
Abstract
Nanoimprint lithography, NIL, is an attractive lithography technique for fine feature pattern fabrication, simple process and low cost of ownership. NIL templates play an important role because templates define the resolution of NIL process. In this paper we discussed fine feature hole template fabrication and their performance such as CD uniformity and image placement along with the feature size and duty ratio. In addition, we proposed to apply LELE(Litho-Etch-Litho-Etch) method to fabricate fine feature hole templates and discussed their performances.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Koji Ichimura, Koji Yoshida, Hideki Cho, Ryugo Hikichi, and Masaaki Kurihara "Characteristics of fine feature hole templates for nanoimprint lithography toward 2nm and beyond", Proc. SPIE 12293, Photomask Technology 2022, 122930F (1 December 2022); https://doi.org/10.1117/12.2643250
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KEYWORDS
Nanoimprint lithography

Critical dimension metrology

Overlay metrology

Image processing

Fabrication

Scanning electron microscopy

Lithography

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