Material recognition using time of flight Lidar surface analysis

Daniel Tafone; Luke McEvoy; Yong Meng Sua; Patrick Rehain; Yuping Huang

doi:10.1117/12.2652945

8 March 2023 Material recognition using time of flight Lidar surface analysis

Daniel Tafone, Luke McEvoy, Yong Meng Sua, Patrick Rehain, Yuping Huang

Proceedings Volume 12447, Quantum Sensing, Imaging, and Precision Metrology; 1244708 (2023) https://doi.org/10.1117/12.2652945
Event: SPIE Quantum West, 2023, San Francisco, California, United States

Abstract

We are investigating a method for identifying materials from a distance, even when they are obscured, using a technique called Quantum Parametric Mode Sorting and single photons detection. By scanning a segment of the material, we are able to capture data on the relationships between the peak count of photons reflected at each position and the location of that reflection. This information allows us to measure the relative reflectance of the material and the texture of its surface, which enables us to achieve a material recognition accuracy of 99%, even maintaining 89.17% when materials are obscured by a lossy and multi-scattering obscurant that causes up to 15.2 round-trip optical depth.

Conference Presentation

Citation Download Citation

Daniel Tafone, Luke McEvoy, Yong Meng Sua, Patrick Rehain, and Yuping Huang "Material recognition using time of flight Lidar surface analysis", Proc. SPIE 12447, Quantum Sensing, Imaging, and Precision Metrology, 1244708 (8 March 2023); https://doi.org/10.1117/12.2652945

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