Paper
31 October 2022 Research on plane defect detection technology of optical communication devices based on machine vision
Author Affiliations +
Proceedings Volume 12457, Second International Conference on Testing Technology and Automation Engineering (TTAE 2022); 124570D (2022) https://doi.org/10.1117/12.2660629
Event: Second International Conference on Testing Technology and Automation Engineering (TTAE 2022), 2022, Changchun, China
Abstract
The processing quality of optical communication devices will affect the performance of the equipment. Therefore, it is necessary to carry out strict inspection on optical communication devices, and they can only leave the factory after passing the test. Judging from the current detection methods, the detection of optical communication devices mainly adopts manual detection methods, resulting in low detection efficiency and subjective influence on the detection results. Aiming at the problems existing in the detection of optical communication devices, this paper studies the defect detection technology of optical communication devices based on machine vision. This paper analyzes the main inspection items and indicators of optical communication devices, the composition of the inspection system and the main module structure, studies different template pairing methods, and designs the corresponding defect detection algorithm according to the imaging characteristics of components and bases on the product. The experimental results show that the components can be successfully matched under different conditions. The detection technology studied in this paper has a low rate of missed detection and false detection and has good defect detection stability and accuracy.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hao Liu, Junhong Yang, Tao Sun, and Jiazan Wang "Research on plane defect detection technology of optical communication devices based on machine vision", Proc. SPIE 12457, Second International Conference on Testing Technology and Automation Engineering (TTAE 2022), 124570D (31 October 2022); https://doi.org/10.1117/12.2660629
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KEYWORDS
Optical communications

Defect detection

Telecommunications

Image processing

Image enhancement

Inspection

Machine vision

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