Angle resolved photo electron spectrometer for hard x-ray photon diagnostics at the European XFEL

J. Laksman; F. Dietrich; J. Liu; Th. Maltezopoulos; N. Kujala; M. Planas; W. Freund; S. Francoual; J. Grünert

doi:10.1117/12.2665732

9 June 2023 Angle resolved photo electron spectrometer for hard x-ray photon diagnostics at the European XFEL

J. Laksman, F. Dietrich, J. Liu, Th. Maltezopoulos, N. Kujala, M. Planas, W. Freund, S. Francoual, J. Grünert

Proceedings Volume 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI; 1258107 (2023) https://doi.org/10.1117/12.2665732
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Abstract

We have developed and commissioned an angle-resolved photoelectron spectrometer, based on the electron time-of-flight concept, for hard x-ray photon diagnostics at the European Free-Electron Laser. The instrument provides users and operators with pulse-resolved, non-invasive spectral distribution diagnostics, which in the hard x-ray regime is a challenge due to the poor cross-section and high kinetic energy of photoelectrons for the available target gases. We report on the performance of this instrument as obtained using hard x-rays at the PETRA III synchrotron at DESY and the SASE1 beamline at the European XFEL. We demonstrate a resolving power of 10 eV at incident photon energies up to 20 keV.

Conference Presentation

Citation Download Citation

J. Laksman, F. Dietrich, J. Liu, Th. Maltezopoulos, N. Kujala, M. Planas, W. Freund, S. Francoual, and J. Grünert "Angle resolved photo electron spectrometer for hard x-ray photon diagnostics at the European XFEL", Proc. SPIE 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, 1258107 (9 June 2023); https://doi.org/10.1117/12.2665732

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