Towards automated analysis of serial crystallography data at the European XFEL

Oleksii Turkot; Fabio Dall'Antonia; Richard J. Bean; Juncheng E.; Hans Fangohr; Danilo E. Ferreira de Lima; Sravya Kantamneni; Henry Kirkwood; Faisal H. M. Koua; Adrian P. Mancuso; Diogo Melo; Adam Round; Egor Sobolev; Raphaël de Wijn; James J. Wrigley; Luca Gelisio

doi:10.1117/12.2669569

9 June 2023 Towards automated analysis of serial crystallography data at the European XFEL

Oleksii Turkot, Fabio Dall'Antonia, Richard J. Bean, Juncheng E., Hans Fangohr, Danilo E. Ferreira de Lima, Sravya Kantamneni, Henry Kirkwood, Faisal H. M. Koua, Adrian P. Mancuso, Diogo Melo, Adam Round, Egor Sobolev, Raphaël de Wijn, James J. Wrigley, Luca Gelisio

Author Affiliations +

Proceedings Volume 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI; 125810M (2023) https://doi.org/10.1117/12.2669569
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Conference Poster

Abstract

In this paper we introduce and discuss the EXtra-Xwiz pipeline for the semi-automated analysis of serial femtosecond crystallography data collected at the European XFEL. EXtra-Xwiz wraps the CrystFEL software suite, exposes data in a CrystFEL-compliant format, handles the interaction with the local high-performance computing cluster and simplifies certain experiment schemes such as the pump-probe one. Alongside with the integration of EXtra-Xwiz into the European XFEL ecosystem, future plans and developments are also briefly discussed.

Citation Download Citation

Oleksii Turkot, Fabio Dall'Antonia, Richard J. Bean, Juncheng E., Hans Fangohr, Danilo E. Ferreira de Lima, Sravya Kantamneni, Henry Kirkwood, Faisal H. M. Koua, Adrian P. Mancuso, Diogo Melo, Adam Round, Egor Sobolev, Raphaël de Wijn, James J. Wrigley, and Luca Gelisio "Towards automated analysis of serial crystallography data at the European XFEL", Proc. SPIE 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, 125810M (9 June 2023); https://doi.org/10.1117/12.2669569

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available