A new test method for digital-to-analog converter

Mengzhang Cheng

doi:10.1117/12.2673944

6 April 2023 A new test method for digital-to-analog converter

Mengzhang Cheng

Proceedings Volume 12615, International Conference on Signal Processing and Communication Technology (SPCT 2022); 126151U (2023) https://doi.org/10.1117/12.2673944
Event: International Conference on Signal Processing and Communication Technology (SPCT 2022), 2022, Harbin, China

Abstract

A new BIST (Built-In Self-Test) method to test static parameters of a DAC (Digital to Analog Converter) is proposed in this paper. The BIST method employs a ramp generator and two voltage references to test static parameters of a DAC: offset error, gain error, INL (Integral Non-Linearity) and DNL (Differential Non-Linearity). The optimization of calculating static parameters and the components sharing can reduce the BIST circuitry. The simulation result shows that the method is able to detect the static errors with the simple BIST structure.

Citation Download Citation

Mengzhang Cheng "A new test method for digital-to-analog converter", Proc. SPIE 12615, International Conference on Signal Processing and Communication Technology (SPCT 2022), 126151U (6 April 2023); https://doi.org/10.1117/12.2673944

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available