Digital holographic microscopy with functionally-integrated waveguide illuminator

Eriko Watanabe

doi:10.1117/12.2675657

15 August 2023 Digital holographic microscopy with functionally-integrated waveguide illuminator

Eriko Watanabe

Proceedings Volume 12618, Optical Measurement Systems for Industrial Inspection XIII; 126181E (2023) https://doi.org/10.1117/12.2675657
Event: SPIE Optical Metrology, 2023, Munich, Germany

Abstract

Holographic 3D imaging through random media has been attracting increasing interest. This paper reviews some of our recent efforts in developing functionally-integrated waveguide illuminators (FIWI). FIWI enables the compact system configuration that is free from strict alignments and bulky optical components required in conventional holographic microscopes, and thereby offers a new dedicated platform for digital holographic microscopy and imaging through random media.

Conference Presentation

Citation Download Citation

Eriko Watanabe "Digital holographic microscopy with functionally-integrated waveguide illuminator", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126181E (15 August 2023); https://doi.org/10.1117/12.2675657

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