Paper
1 May 1990 Target x-ray source lithography and photolithography mixed and match system
Shuzo Hattori, Shinzo Morita, Akihiro Yoshida, Tsutomu Nomura, Takashi Tagawa, Hideshi Yoshikawa
Author Affiliations +
Abstract
Target X-ray source lithography and photo lithography mixed and match system was proposed for an effective lithography system. The key technology for the system is a projection moire alignment, whose marks are used for both photo and X-ray lithography. In order to realize the systeimi, related technologies and apparatus are developing, which are photo and X-ray stepper, Xray source of radiation cooled slotted Pd target, X-ray mask and X-ray mask inspection system.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuzo Hattori, Shinzo Morita, Akihiro Yoshida, Tsutomu Nomura, Takashi Tagawa, and Hideshi Yoshikawa "Target x-ray source lithography and photolithography mixed and match system", Proc. SPIE 1263, Electron-Beam, X-Ray, and Ion-Beam Technology: Submicrometer Lithographies IX, (1 May 1990); https://doi.org/10.1117/12.20150
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

Photomasks

X-ray lithography

X-ray sources

Lithography

X-ray technology

Inspection

RELATED CONTENT

Fabrication of 1-Mbit DRAMs By Using X-Ray Lithography
Proceedings of SPIE (August 01 1989)
Present status of x-ray lithography
Proceedings of SPIE (September 01 1998)
Submicron X-Ray Replication Technology For Early Application
Proceedings of SPIE (November 07 1983)
SOR Lithography in West Germany
Proceedings of SPIE (August 01 1989)
Evaluation of a laser-based proximity x-ray stepper
Proceedings of SPIE (July 09 1992)

Back to Top