Paper
1 August 1990 Full-field Fourier fringe analysis for industrial inspection
Andrew A. Malcolm, David R. Burton, Michael J. Lalor
Author Affiliations +
Proceedings Volume 1265, Industrial Inspection II; (1990) https://doi.org/10.1117/12.20245
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
Surface parameterisation using phase measurement of interferometric fringe patterns is supported by a strong theoretical basis. However, little work has been published with regard to the practical implementation of the available methods as tools for industrial inspection. This paper attempts to justify the choice of Fourier Fringe Analysis for this purpose and addresses some aspects of its implementation.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew A. Malcolm, David R. Burton, and Michael J. Lalor "Full-field Fourier fringe analysis for industrial inspection", Proc. SPIE 1265, Industrial Inspection II, (1 August 1990); https://doi.org/10.1117/12.20245
Lens.org Logo
CITATIONS
Cited by 9 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Fringe analysis

Inspection

Image segmentation

Image processing

Optical filters

Fourier transforms

Linear filtering

Back to Top