Presentation + Paper
28 September 2023 Deterministic geometrical analysis of sequential stray light from ideal baffles and extended sources
Author Affiliations +
Abstract
Sequential analysis of stray light through a system in the past has only incorporated stray light from a point source scattering off optical surfaces due to contamination and roughness. Any analysis requiring more fidelity required the power of non-sequential ray trace software, which is limited in both speed and sampling. The software presented in this paper expands upon the previously discussed sequential analysis by adding more functionality and detail to the analysis. This includes scatter contributions from an ideal mechanical baffle located at the entrance to the system and the stray light resulting from extended sources, such as an illuminated Earth or Moon. An example case study is presented to demonstrate the correlation to a matching non-sequential analysis of the system.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haley Knapp, Ian Carr, and Michael Dittman "Deterministic geometrical analysis of sequential stray light from ideal baffles and extended sources", Proc. SPIE 12664, Optical Modeling and Performance Predictions XIII, 1266406 (28 September 2023); https://doi.org/10.1117/12.2675625
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KEYWORDS
Baffles

Stray light

Ray tracing

MATLAB

Optical surfaces

Aerospace engineering

Contamination

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