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We are developing a next-generation scanning x-ray microscope that will significantly enhance 3D ptychographic imaging capabilities available at NSLS-II. One of the important technical tasks pertains to providing high-speed data acquisition using fly-scanning, which may hold a significant advantage overstep scanning. The developed state-of-the-art x-ray microscope is EPICS-compatible and utilizes piezo actuators for fast raster scanning. The position is monitored by laser interferometers (or native encoders) and transferred to an FPGA-based device (Zebra box), which outputs detector trigger signals at a high frequency. The developed system is supported in a standard NSLS-II controls environment and can be implemented at existing and to-be-developed beamlines. At present, a similar fly-scanning capability is deployed at Submicron Resolution x-ray Spectroscopy (SRX) and Hard X-ray Nanoprobe (HXN) beamlines at NSLS-II.
Conference Presentation
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Weihe Xu, Huijuan Xu, Dmitri Gavrilov, Xiaojing Huang, Hanfei Yan, Yong S. Chu, Evgeny Nazaretski, "High-speed fly-scan capabilities for x-ray microscopy systems at NSLS-II," Proc. SPIE 12698, X-Ray Nanoimaging: Instruments and Methods VI, 126980B (5 October 2023); https://doi.org/10.1117/12.2675940