In this work, we explore the manifestation of optical nonlinearities in silicon, given illumination by radiation with wavelengths in the optical communication (C-band) spectrum, near 1550 nm, and extreme intensities, spanning 100-1000 GW/cm2. We photoexcite a silicon photodiode with femtosecond-duration 1550-nm laser pulses and observe the resulting optical autocorrelations as a function of the peak pulse intensity. Such measurements in silicon reveal (i) negligible single-photon absorption, suggesting that there are few defect (trap) states in the bandgap that can assist below-bandgap photoexcitation, (ii) significant two-photon absorption at intensities above 100 GW/cm2, (iii) growing three-photon absorption at intensities rising above a threshold of 300 GW/cm2, and (iv) increasing saturation at intensities rising above a threshold of 650 GW/cm2. We attribute this saturation to the extremely high density of charge carriers brought about by three-photon absorption—as this depletes the available electrons in the valence band and the available states in the conduction band. We hope that this work will be a foundation for the future integration of telecom (C-band) technologies and silicon nanostructures.
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