Focal length measurement of Greek-ladder photon sieves using quasi-Walsh phase retrieval

Gangwei Wang; Xiuping Zhang; Junyong Zhang; Cheng Liu

doi:10.1117/12.3007658

24 November 2023 Focal length measurement of Greek-ladder photon sieves using quasi-Walsh phase retrieval

Gangwei Wang, Xiuping Zhang, Junyong Zhang, Cheng Liu

Author Affiliations +

Proceedings Volume 12935, Fourteenth International Conference on Information Optics and Photonics (CIOP 2023); 129352N (2023) https://doi.org/10.1117/12.3007658
Event: Fourteenth International Conference on Information Optics and Photonics (CIOP 2023), 2023, Xi’an, China

Abstract

Diffraction lens had been widely used in the field of super-resolution imaging, laser dicing, and particle trapping. Although Greek-ladder photon sieves is a kind of amplitude-only diffraction lens and suitable for EUV and soft x-ray focusing and imaging, the focal length are hard to be measured precisely by non-destruction testing due to its fine feature. Here quasi-Walsh phase retrieval is proposed to measure the focal length in one-single exposure. Compared to the random scatter plate, a quasi-Walsh phase plate can not only greatly decrease the alignment precision, but also provide the unique solution of the test wavefront. Simulation experiments show that the proposed single-shot Walsh-modulation phase retrieval can measure the focal lengths of the Greek-ladder photon sieves with high precision, which can greatly facilitate the development of multi-focal diffraction lens.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Gangwei Wang, Xiuping Zhang, Junyong Zhang, and Cheng Liu "Focal length measurement of Greek-ladder photon sieves using quasi-Walsh phase retrieval", Proc. SPIE 12935, Fourteenth International Conference on Information Optics and Photonics (CIOP 2023), 129352N (24 November 2023); https://doi.org/10.1117/12.3007658

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KEYWORDS

Diffraction

Phase retrieval

Wavefronts

Charge-coupled devices

Complex amplitude

X-ray imaging

X-rays

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