Rigid body motion tracking in axial shift mapping for measuring astronomical X-ray mirror figure

Brandon D. Chalifoux; Hayden J. Wisniewski; Mark L. Schattenburg; Ralf K. Heilmann; Ian J. Arnold; Mallory M. Whalen

doi:10.1117/12.3025087

18 June 2024 Rigid body motion tracking in axial shift mapping for measuring astronomical X-ray mirror figure

Brandon D. Chalifoux, Hayden J. Wisniewski, Mark L. Schattenburg, Ralf K. Heilmann, Ian J. Arnold, Mallory M. Whalen

Proceedings Volume 12997, Optics and Photonics for Advanced Dimensional Metrology III; 129970U (2024) https://doi.org/10.1117/12.3025087
Event: SPIE Photonics Europe, 2024, Strasbourg, France

Abstract

Future X-ray telescopes will require measuring thousands of grazing-incidence mirrors with nanometer accuracy and high throughput. Fizeau interferometry will require accurately separating the reference surface from the surface under test, a challenging proposition for optical surfaces that are highly off-axis conics. We present a lateral shifting interferometry approach called Axial Shift Mapping (ASM), in which we measure the surface under test at multiple positions and numerically separate the reference and test surfaces. In this paper, we estimate the measurement accuracy that would be required for an exemplary 0.5 arcsecond half-power diameter angular resolution telescope. We mathematically describe the procedure for using ASM, plus a lateral shift, to extract the most important quantities for X-ray telescope mirrors: axial profile (including the quadratic component) and cone angle variation. We also conclude that the radius and cone angle of a mirror are unknowable with ASM alone.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Brandon D. Chalifoux, Hayden J. Wisniewski, Mark L. Schattenburg, Ralf K. Heilmann, Ian J. Arnold, and Mallory M. Whalen "Rigid body motion tracking in axial shift mapping for measuring astronomical X-ray mirror figure", Proc. SPIE 12997, Optics and Photonics for Advanced Dimensional Metrology III, 129970U (18 June 2024); https://doi.org/10.1117/12.3025087

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available