Poster + Paper
18 June 2024 Ellipsometrical characterization of poly-dopamine layers considered for technical applications
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Conference Poster
Abstract
Although the organic molecule dopamine (3,4-dihydroxyphenethylamine) is commonly known as the “hormone of happiness”, thin films of poly-dopamine also have interesting technical properties. When produced by dip coating, the self-organizing layers grow in a reproducible thickness of single or multiple molecule monolayers of a few nanometer thickness only. In this work, we introduce a method of determining the layer thickness of poly-dopamine on mirrors for astronomical X-ray telescopes. This work is based on spectroscopic ellipsometry measurements and involves the development of an optical model for the poly-dopamine layers including the dielectric function. Thereby the complex refractive index of the produced layers was determined, covering the range from the ultraviolet to the near infrared spectral region. These measurement results and the corresponding technical challenges are presented in this contribution. Furthermore, an outlook to potential technical applications of this interesting material is given and poly-dopamine layers will make scientist and engineers hopefully happy as an innovative and fascinating technical solution for the future.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Elena Ermilova, Andreas Hertwig, Thorsten Döhring, Eva Stanik, Vincenzo Cotroneo, and Eugenio Gibertini "Ellipsometrical characterization of poly-dopamine layers considered for technical applications", Proc. SPIE 13013, Organic Electronics and Photonics: Fundamentals and Devices IV, 1301309 (18 June 2024); https://doi.org/10.1117/12.3015281
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KEYWORDS
Refractive index

Data modeling

Astronomy

Mirrors

Near infrared

X-rays

Reflection

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