Development of an experimental facility for the measurement of photo-induced thermal emission in interferential filters

François Thullier; Myriam Zerrad; Claude Amra; Hélène Krol

doi:10.1117/12.3017381

24 June 2024 Development of an experimental facility for the measurement of photo-induced thermal emission in interferential filters

François Thullier, Myriam Zerrad, Claude Amra, Hélène Krol

Author Affiliations +

Proceedings Volume 13020, Advances in Optical Thin Films VIII; 130200A (2024) https://doi.org/10.1117/12.3017381
Event: SPIE Optical Systems Design, 2024, Strasbourg, France

Abstract

In this contribution we show encouraging results of photo-induced thermal emission measurements, in nanosecond regime, for metallic layers and multilayers. The experimental setup of the instrument is presented. A comparison with the results given by numerical simulation is also highlighted, which allows to estimate the thermal parameters of thin films.

Conference Presentation

Citation Download Citation

François Thullier, Myriam Zerrad, Claude Amra, and Hélène Krol "Development of an experimental facility for the measurement of photo-induced thermal emission in interferential filters", Proc. SPIE 13020, Advances in Optical Thin Films VIII, 130200A (24 June 2024); https://doi.org/10.1117/12.3017381

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