Paper
7 June 2024 Ray-tracing modeling for submillimeters
Vasyl Molebny, Vyacheslav Sokurenko, Jing Hui
Author Affiliations +
Abstract
Fast developing sub-millimeter wavelength technologies sparked off interest of the microwave community to the applicability of the optical methods for sub-millimeter system design, specifically, for aberration minimization. Both, either sphere in optics, or parabola in microwaves, need aberration correction to get the high-quality imaging in the wide-angle scanning mode. I the prototype for modification according to the results of our modeling, horizontal direction of scanning is used. Linear detector arrays is vertically oriented and configured in three columns to triple the vertical detector density for higher spatial resolution. Using the ray tracing technique, we modeled the minimization of aberrations within the whole scanning span by designing the free-form surfaces of antennas up to 7-th order of Zernike polynomials. We modeled the wavefront correction by changing the profile of mirror surfaces of antenna reflectors.
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Vasyl Molebny, Vyacheslav Sokurenko, and Jing Hui "Ray-tracing modeling for submillimeters", Proc. SPIE 13048, Radar Sensor Technology XXVIII, 1304812 (7 June 2024); https://doi.org/10.1117/12.3013229
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KEYWORDS
Mirror surfaces

Modeling

Antennas

Mathematical optimization

Mirrors

Zernike polynomials

Detector arrays

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