360 degree unique and robust matching method for the infrared optical features of handheld target

Junkai Duan; Zhan Song; Yuping Ye; Feifei Gu

doi:10.1117/12.3013469

4 March 2024 360 degree unique and robust matching method for the infrared optical features of handheld target

Junkai Duan, Zhan Song, Yuping Ye, Feifei Gu

Proceedings Volume 13070, Speckle 2023: VIII International Conference on Speckle Metrology; 1307003 (2024) https://doi.org/10.1117/12.3013469
Event: Speckle 2023: VIII International Conference on Speckle Metrology, 2023, Xi'an, China

Abstract

Portable optical target measurement systems have widespread applications in various fields, including mechanical manufacturing, aerospace, industrial inspection, and clinical medicine. This study aims to address the marker point matching problem in binocular measurement systems. Through image preprocessing and mathematical algorithms, we have successfully achieved robust matching of marker points with uniqueness. We first converted color images to grayscale and applied the Otsu algorithm to adaptively select a global threshold, successfully extracting marker points. Using the nearest neighbor algorithm, we simplified 28 marker points to 7. Then, we employed the k-means clustering algorithm to achieve a second fitting, obtaining marker points located on the central line of the target. With these marker points, we computed key features for describing the target pose, including the direction vector of the target’s central line and its angle with respect to the image’s x-axis. Finally, we designed different algorithm modules to successfully achieve the robust matching of marker points across 360 degrees of free postures.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Junkai Duan, Zhan Song, Yuping Ye, and Feifei Gu "360 degree unique and robust matching method for the infrared optical features of handheld target", Proc. SPIE 13070, Speckle 2023: VIII International Conference on Speckle Metrology, 1307003 (4 March 2024); https://doi.org/10.1117/12.3013469

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