Prototype fine-imaging narrow field of view semiconductor Compton telescope with shielded coded-mask, mini-SGI

Keigo Okuma; Kazuhiro Nakazawa; Shin'ichiro Takeda; Yuta Nishimura; Mii Ando; Yuki Omiya; Manari Oguchi; Atsuya Tanaka; Shin Watanabe; Tadayuki Takahashi; Masahiko Kobayashi; Naoki Ishida; Takahiro Minami; Mitsunobu Onishi; Toshihiko Arai

doi:10.1117/12.3019754

21 August 2024 Prototype fine-imaging narrow field of view semiconductor Compton telescope with shielded coded-mask, mini-SGI

Keigo Okuma, Kazuhiro Nakazawa, Shin'ichiro Takeda, Yuta Nishimura, Mii Ando, Yuki Omiya, Manari Oguchi, Atsuya Tanaka, Shin Watanabe, Tadayuki Takahashi, Masahiko Kobayashi, Naoki Ishida, Takahiro Minami, Mitsunobu Onishi, Toshihiko Arai

Author Affiliations +

Proceedings Volume 13093, Space Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray; 130937W (2024) https://doi.org/10.1117/12.3019754
Event: SPIE Astronomical Telescopes + Instrumentation, 2024, Yokohama, Japan

Conference Poster

Abstract

Semiconductor Compton telescope (SCT) is one of the promising technologies in cosmic MeV gamma-ray observation, because of good angular resolution measure thanks to its high energy and positional resolutions. However, it cannot be better than a few degrees because of quantum limitation, known as doppler broadening. With improving sensitivity in MeV astronomy, realization of 10-arcmin-level of angular resolution is becoming more important. Combining a coded-aperture mask imaging to SCT is the simplest measure to obtain this level of angular resolution in MeV astronomy. Since the mask made of heavy metal is a BGD source and contribution from bright sources and CXB limits the statistical significance of the mask decoding, we propose the concept of attaching a coded mask to a narrow-field Si/CdTe SCT such as the SGD on the ASTRO-H mission. We developed a concept verification system, mini-SGI, adopting 0.5 mm thick DSSDs and 2 mm thick CdTe-DSD, covered with BGO active shield. By irradiating a ¹³³Ba source, we succeeded to obtain 1° resolution coded-mask imaging applied to Compton reconstructed image with ARM resolution of 9.8 degree and 3.0 degree to 81 keV and 356 keV lines, respectively.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Keigo Okuma, Kazuhiro Nakazawa, Shin'ichiro Takeda, Yuta Nishimura, Mii Ando, Yuki Omiya, Manari Oguchi, Atsuya Tanaka, Shin Watanabe, Tadayuki Takahashi, Masahiko Kobayashi, Naoki Ishida, Takahiro Minami, Mitsunobu Onishi, and Toshihiko Arai "Prototype fine-imaging narrow field of view semiconductor Compton telescope with shielded coded-mask, mini-SGI", Proc. SPIE 13093, Space Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray, 130937W (21 August 2024); https://doi.org/10.1117/12.3019754

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available