Presentation + Paper
30 September 2024 Polarization-guided deflectometry
Jiazhang Wang, Oliver Cossairt, Florian Willomitzer
Author Affiliations +
Abstract
Phase Measuring Deflectometry (PMD) is an optical metrology method for accurate 3D imaging of specular surfaces. So far, one of the limitations that has hindered the broader application of PMD outside metrology is the so-called height-normal ambiguity problem. Current solutions to this problem either rely on prior knowledge of the object’s shape or introduce additional hardware components (camera or display) to the setup. In this contribution, we propose a novel PMD concept that solves the height-normal ambiguity problem by leveraging polarization cues. We replace the classic deflectometry setup with an unpolarized display and a polarization camera. This allows us to uniquely calculate the reflection angle with the assistance of polarization cues, leading to simultaneous estimation of surface points and surface normals without ambiguity. Our method is capable of measuring complex surfaces since it does not require prior knowledge of the surface shape. Furthermore, our method requires only one camera, which can enhance measurement coverage compared to stereo PMD. Our experiments demonstrate sub-degree normal accuracy and successful reconstruction of complex surface shapes.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Jiazhang Wang, Oliver Cossairt, and Florian Willomitzer "Polarization-guided deflectometry", Proc. SPIE 13135, Interferometry and Structured Light 2024, 1313507 (30 September 2024); https://doi.org/10.1117/12.3027356
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KEYWORDS
Cameras

Deflectometry

Polarization

Reflection

Specular reflections

Phase measurement

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