Microstructural details with directional dark-field imaging using Talbot-Lau interferometer

Yumin Heo; Daeseung Kim; Junhyeok Won; Junyoung Son; Seungwook Lee

doi:10.1117/12.3027977

4 October 2024 Microstructural details with directional dark-field imaging using Talbot-Lau interferometer

Yumin Heo, Daeseung Kim, Junhyeok Won, Junyoung Son, Seungwook Lee

Author Affiliations +

Proceedings Volume 13152, Developments in X-Ray Tomography XV; 131521Q (2024) https://doi.org/10.1117/12.3027977
Event: Optical Engineering + Applications, 2024, San Diego, California, United States

Conference Poster

Abstract

The Talbot-Lau grating interferometer advances x-ray imaging by enabling phase contrast, dark-field imaging, and differential phase contrast imaging with lab-based x-ray sources, alongside conventional absorption images. This study explores directional dark-field imaging (DDFI) to reveal microstructural details in samples. Using a Talbot-Lau setup, we measured materials like carbon fiber, demonstrating DDFI's effectiveness in visualizing anisotropy, orientation, and microstructure. By rotating the sample and analyzing scattering directions, we showcase DDFI's ability to describe complex material features. Our findings indicate DDFI's potential in materials science, offering new insights into sample characterization and analysis.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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Yumin Heo, Daeseung Kim, Junhyeok Won, Junyoung Son, and Seungwook Lee "Microstructural details with directional dark-field imaging using Talbot-Lau interferometer", Proc. SPIE 13152, Developments in X-Ray Tomography XV, 131521Q (4 October 2024); https://doi.org/10.1117/12.3027977

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