Paper
5 June 2024 A method for selecting crossline two point sequential grounding fault lines for reliability enhancement
Lei Xia, Hai Wu, Qi Huang, Cheng Zhou
Author Affiliations +
Proceedings Volume 13163, Fourth International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024); 1316339 (2024) https://doi.org/10.1117/12.3030119
Event: International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024), 2024, Xi'an, China
Abstract
At present, the detection technology for single-phase grounding faults in small current grounding systems has gradually matured, and the on-site application effect is gradually improving. However, there is relatively little research on the consecutive grounding faults at two points across the line. This article focuses on the transient characteristics of two consecutive grounding faults with the same and different phases in a small current grounding system. A transient equivalent circuit model is established, and the transient characteristics of single-phase grounding fault lines are analyzed. The variation law of transient characteristics of fault lines with different fault conditions is obtained. Based on this, a cross line two point sequential grounding fault line selection method based on continuous detection of fault transient quantities is proposed, and the correctness and feasibility of the proposed method are verified through digital simulation.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Lei Xia, Hai Wu, Qi Huang, and Cheng Zhou "A method for selecting crossline two point sequential grounding fault lines for reliability enhancement", Proc. SPIE 13163, Fourth International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2024), 1316339 (5 June 2024); https://doi.org/10.1117/12.3030119
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Resistance

Capacitance

Reliability

Power supplies

Switches

Inductance

Computer simulations

Back to Top