Investigation of the effect of applying continuous wavelet analysis on the NIST FFT test passing performance of random noise generated by an InGaAs p-i-n photodiode-based optical random number generator

Mansur E. Sibgatullin; Danil A. Mavkov; Lenar R. Gilyazov; Narkis M. Arslanov

doi:10.1117/12.3026581

6 September 2024 Investigation of the effect of applying continuous wavelet analysis on the NIST FFT test passing performance of random noise generated by an InGaAs p-i-n photodiode-based optical random number generator

Mansur E. Sibgatullin, Danil A. Mavkov, Lenar R. Gilyazov, Narkis M. Arslanov

Author Affiliations +

Proceedings Volume 13168, Optical Technologies for Telecommunications 2023; 1316815 (2024) https://doi.org/10.1117/12.3026581
Event: Optical Technologies for Telecommunications 2023, 2023, Kazan, Russian Federation

Abstract

In this paper, a random noise study is carried out, generated by an optical random number generator based on an InGaAs p-i-n photodiode. The influence of the procedure of equalization of the energy values of the of the continuous wavelet transform on the efficiency of passing the test for the FFT randomness from the set of NIST statistical tests.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Mansur E. Sibgatullin, Danil A. Mavkov, Lenar R. Gilyazov, and Narkis M. Arslanov "Investigation of the effect of applying continuous wavelet analysis on the NIST FFT test passing performance of random noise generated by an InGaAs p-i-n photodiode-based optical random number generator", Proc. SPIE 13168, Optical Technologies for Telecommunications 2023, 1316815 (6 September 2024); https://doi.org/10.1117/12.3026581

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