Comparison of 632nm laser dazzling effect on CCD and CMOS image sensors

Hengyan Zhou; Chao Li; Hang Zhao; Tiancheng Yu; Zhenghao Qin

doi:10.1117/12.3037275

4 December 2024 Comparison of 632nm laser dazzling effect on CCD and CMOS image sensors

Hengyan Zhou, Chao Li, Hang Zhao, Tiancheng Yu, Zhenghao Qin

Author Affiliations +

Proceedings Volume 13283, Conference on Spectral Technology and Applications (CSTA 2024); 132834O (2024) https://doi.org/10.1117/12.3037275
Event: Conference on Spectral Technology and Applications (CSTA 2024), 2024, Dalian, China

Abstract

In order to compare the laser dazzling effects of CCD and CMOS image sensors, dazzling experiments with the wavelength of 632nm laser are conducted, including direct laser irradiation on CCD and CMOS image sensors, laser irradiation on CCD and CMOS image sensors via an imaging lens, and laser irradiation on different models of CCD and CMOS image sensors via an imaging lens. The pixel-level saturation thresholds and full-screen saturation thresholds of CCD and CMOS image sensors at different conditions are summarized. The experimental results show that CMOS image sensor is more difficult to be dazzled than CCD image sensor at the same experimental condition, and the saturation threshold of the former is one order of magnitude higher than that of the latter. Image sensors equipped with imaging lens are more difficult to be dazzled than image sensors without imaging lens, and the saturation threshold of the former is 3~4 orders of magnitude higher than that of the latter. The exposure modes of image sensors have certain impact on the dazzling effect, and the automatic exposure mode can weaken the laser dazzling effect to a certain extent. Finally, the mechanism of the special dazzling phenomena such as saturation crosstalk and pixel upset is explained.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Hengyan Zhou, Chao Li, Hang Zhao, Tiancheng Yu, and Zhenghao Qin "Comparison of 632nm laser dazzling effect on CCD and CMOS image sensors", Proc. SPIE 13283, Conference on Spectral Technology and Applications (CSTA 2024), 132834O (4 December 2024); https://doi.org/10.1117/12.3037275

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KEYWORDS

Charge-coupled devices

CCD image sensors

CMOS sensors

Laser irradiation

Image sensors

Crosstalk

Laser damage threshold

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