Paper
10 December 2024 Zernike polynomial-based pupil wavefront optimization technology for extreme ultraviolet lithography
Miao Yuan, Zhaoxuan Li, He Yang, Zhen Li, Yuqing Chen, Yanqiu Li
Author Affiliations +
Proceedings Volume 13423, Eighth International Workshop on Advanced Patterning Solutions (IWAPS 2024); 134231K (2024) https://doi.org/10.1117/12.3055164
Event: 8th International Workshop on Advanced Patterning Solutions (IWAPS 2024), 2024, Jiaxing, Zhejiang, China
Abstract
The NA 0.33 EUV lithography tool is applied at 3nm logic node where the aberrations and 3D mask effects are difficult to eliminate. It limits resolution further reduced. In this paper, a Zernike polynomial-based pupil wavefront optimization (ZBPWO) technology for NA0.33 EUV is proposed. An active wavefront is applied to the imaging model which consist of 64 Zernike polynomials using an inverse optimization algorithm. The optimal pupil wavefront can improve image quality effectively. Simulation results show that the ZBPWO method reduce the pattern error about 50%. It demonstrate the impact of aberrations and 3D mask effects are controlled very well.
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Miao Yuan, Zhaoxuan Li, He Yang, Zhen Li, Yuqing Chen, and Yanqiu Li "Zernike polynomial-based pupil wavefront optimization technology for extreme ultraviolet lithography", Proc. SPIE 13423, Eighth International Workshop on Advanced Patterning Solutions (IWAPS 2024), 134231K (10 December 2024); https://doi.org/10.1117/12.3055164
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KEYWORDS
Wavefronts

Pupil aberrations

Zernike polynomials

Extreme ultraviolet lithography

Mathematical optimization

Wavefront aberrations

Lithography

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