Paper
1 January 1991 Development of subnanosecond framing cameras in IOFAN
V. V. Ludikov, Alexander M. Prokhorov, Victor K. Chevokin
Author Affiliations +
Abstract
Highspeed framing cameras are basic diagnostic tools for recording shortlived transient optical events. We have designed built and tested three types of fast framing cameras operating in the visible spectral region from 400 mu to 850 nm. The first type of framing camera is the gated proximity-focused microchannel-plate (MCP) image intensifier. Shuttering is achieved by applying a forward-biasing electrical gate pulse to the quiencently reverse-biased photocatode-MCP intensifier. Gating speeds turn-on and turn-off patterns the asymmetric spatial dependence photocathode-MCP bias have been characterized. The second framing camera is based on the image tube PIM-lO5B which incorporates a photocathode a shutter grid a focusing system an anode diaphragm and two pairs mutually perpendicular deflecting plates. The results of dynamics tests of the camera and its principal technical specifications are presented. The third framing camera is based on the image tube consisting of a dissector section and a restorer section. The dissector component is similar to a conventional streak tube exept for the replacement of the phospor screen with a slit aperture plate. The restorer section consists of a set of compensator plates an electron lens restore deflector plates and phosphor screen. This type of image tube was pionired by R. Kalibjian. Dynamic tests of this framing camera are also presented. In this report we wish to present various circuits developed for pulsed operation of subnanosecond framing cameras and to investigate some problems arising
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. V. Ludikov, Alexander M. Prokhorov, and Victor K. Chevokin "Development of subnanosecond framing cameras in IOFAN", Proc. SPIE 1346, Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90, (1 January 1991); https://doi.org/10.1117/12.23377
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KEYWORDS
Printed circuit board testing

Cameras

High speed photography

Velocimetry

Resistance

Picosecond phenomena

Microchannel plates

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