Research on spectral retro-reflection standard measurement and calibration device

Chundi Zheng; Guojin Feng; Tianshuo Li; Houping Wu; Weijie Wang; Tao Liang; Xikuai Xie; Qiaozhang Zhang; Haiyong Gan; Yingwei He

doi:10.1117/12.3047641

13 December 2024 Research on spectral retro-reflection standard measurement and calibration device

Chundi Zheng, Guojin Feng, Tianshuo Li, Houping Wu, Weijie Wang, Tao Liang, Xikuai Xie, Qiaozhang Zhang, Haiyong Gan, Yingwei He

Author Affiliations +

Proceedings Volume 13498, AOPC 2024: Optoelectronics Testing and Measurement; 134980B (2024) https://doi.org/10.1117/12.3047641
Event: Applied Optics and Photonics China 2024 (AOPC2024), 2024, Beijing, China

Abstract

This paper reported the research and establishment of a set of spectral retro-reflection standard measurement and calibration device. Based on the physical definition and measurement principle of spectral retro-reflection standard, a calibration device that can provide stable and reliable measurement results in the spectral band of 380nm - 780nm and under key retro-reflection measurement geometric conditions (incident angle: -4° - 30°, observation angle: 0.2° - 1°) was constructed and implemented through the precise optical path design integrating a stable light source and optical fiber spectrometer. Experiments showed that the device performed well in measurement accuracy and consistency. Measurement verification experiments were carried out with the national retro-reflection coefficient calibration device, and the optimal consistency measurement results for the same sample under characteristic conditions were better than 1.0%. This work has positive significance for further promoting the application of retroreflective materials in transportation, safety, intelligent connected vehicles and other fields.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Chundi Zheng, Guojin Feng, Tianshuo Li, Houping Wu, Weijie Wang, Tao Liang, Xikuai Xie, Qiaozhang Zhang, Haiyong Gan, and Yingwei He "Research on spectral retro-reflection standard measurement and calibration device", Proc. SPIE 13498, AOPC 2024: Optoelectronics Testing and Measurement, 134980B (13 December 2024); https://doi.org/10.1117/12.3047641

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