Surface field measurement of photoconductive power switches using the electro-optic Kerr effect

Harshad P. Sardesai; William C. Nunnally; Paul Frazer Williams

doi:10.1117/12.25058

1 March 1991 Surface field measurement of photoconductive power switches using the electro-optic Kerr effect

Harshad P. Sardesai, William C. Nunnally, Paul Frazer Williams

Proceedings Volume 1378, Optically Activated Switching; (1991) https://doi.org/10.1117/12.25058
Event: Advances in Intelligent Robotics Systems, 1990, Boston, MA, United States

Abstract

We report our investigations of the surface electric fields present between the contacts of an optically controlled semiconductor switch. The experimental arrangement uses the Kerr electrooptic effect to measure the surface fields when a pulsed voltage is applied across a gap between two electrodes on planar samples fabricated on a silicon wafer. The system arrangement measurement technique and preliminary experimental data is presented for deposited aluminium contacts.

Citation Download Citation

Harshad P. Sardesai, William C. Nunnally, and Paul Frazer Williams "Surface field measurement of photoconductive power switches using the electro-optic Kerr effect", Proc. SPIE 1378, Optically Activated Switching, (1 March 1991); https://doi.org/10.1117/12.25058

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