Paper
1 August 1990 A new low-cost analytical plotter applied to architectural drawings and crack propagation studies
John Uren, Philippa R. Thomas
Author Affiliations +
Proceedings Volume 1395, Close-Range Photogrammetry Meets Machine Vision; 13950L (1990) https://doi.org/10.1117/12.2294264
Event: Close-Range Photogrammetry Meets Machine Vision, 1990, Zurich, Switzerland
Abstract
This paper outlines research being undertaken in the Civil Engineering Department at Leeds University, England, using a new, low-cost analytical photogrammetric plotter. The project, which is funded by the UK Science and Engineering Research Council ,involves the use of an MPS-2 desktop analytical plotting system, manufactured by Adam Technology of Australia, to produce architectural drawings and to monitor crack propagation in structures. Details are given of the working system which consists of metric and non-metric cameras, a personal computer, an interface to AutoCAD software and a rolling drum plotter. The areas of application being investigated are illustrated by studies of buildings and structures in the civil engineering laboratory of the University and around the Leeds area. The problems encountered are summarised and an assessment of the system is made. The paper concludes with a discussion of the progress of the research project and reviews the work still to be undertaken.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Uren and Philippa R. Thomas "A new low-cost analytical plotter applied to architectural drawings and crack propagation studies", Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13950L (1 August 1990); https://doi.org/10.1117/12.2294264
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photogrammetry

Photography

Cameras

Buildings

Analytical research

Civil engineering

Machine vision

Back to Top