Excite-probe two-color Z-scan

Jiang-Wei Wang; Mansoor Sheik-Bahae; Ali A. Said; David J. Hagan; Eric W. Van Stryland

doi:10.1117/12.138069

18 August 1992 Excite-probe two-color Z-scan

Jiang-Wei Wang, Mansoor Sheik-Bahae, Ali A. Said, David J. Hagan, Eric W. Van Stryland

Proceedings Volume 1692, Nonlinear and Electro-Optic Materials for Optical Switching; (1992) https://doi.org/10.1117/12.138069
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

Using an excite-i,robe two-co1or Zscan technique, we investigate the dynamics of optical nonlinearites in semiconductors with picosecond pulses at 1.06 and 0.532 pm. We use the technique to obtain a direct timeresolved measurement of the nondegenerate nonlinear refraction in polycrystalline ZnSe and show how it can resolve the bound electronic and free carrier components.

Citation Download Citation

Jiang-Wei Wang, Mansoor Sheik-Bahae, Ali A. Said, David J. Hagan, and Eric W. Van Stryland "Excite-probe two-color Z-scan", Proc. SPIE 1692, Nonlinear and Electro-Optic Materials for Optical Switching, (18 August 1992); https://doi.org/10.1117/12.138069

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