Paper
28 August 1992 A 6032 x 32 time-delay and integration abuttable image sensor for use in airborne reconnaissance applications
Stephen J. Strunk, John R.F. McMacken, Stacy R. Kamasz, William D. Washkurak, Gordon Harling, John A. Lund, William R. Pfister
Author Affiliations +
Abstract
Time-Delay and Integration (TDI) CCD sensors have been proven to increase the effective sensitivity in imaging applications where the image is scanned across the focal plane. This paper describes the development of a 6032 element, 32-stage TDI imager for airborne reconnaissance applications. The device is fabricated using a 3-poly 3-phase NMOS process, incorporating buried channel CCDs throughout. It is one-side buttable to produce an array of over 12,000 contiguous elements and is capable of read rates of over 4000 lines per second. For fast readout, the design incorporates dual horizontal CCDs for a total of four outputs in the abutted configuration. The architecture also allows dynamic selection in the number of TDI stages.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen J. Strunk, John R.F. McMacken, Stacy R. Kamasz, William D. Washkurak, Gordon Harling, John A. Lund, and William R. Pfister "A 6032 x 32 time-delay and integration abuttable image sensor for use in airborne reconnaissance applications", Proc. SPIE 1693, Surveillance Technologies II, (28 August 1992); https://doi.org/10.1117/12.138107
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Cited by 1 scholarly publication.
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KEYWORDS
Charge-coupled devices

Surveillance

Electrons

Capacitance

Modulation transfer functions

Clocks

Image sensors

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