PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
This paper presents a new and simple technique of phase retardation measurement. It is based on computer aided analysis of diffraction pattern generated by phase object. Application of this method to known intensity distribution in Fourier spectrum allows to find phase distribution in an object. The method is especially aligned for techniques where an unknown phase modulation is gained by exposure of a photo-sensitive media. The described method can help to predict the desired phase shift from exposure and is especially aligned to the problem of Holographic Optical Elements (HOE) manufacturing.
Maciej Sypek
"Reverse phase-contrast problem in optical technology", Proc. SPIE 1846, Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, (3 May 1994); https://doi.org/10.1117/12.171883
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Maciej Sypek, "Reverse phase-contrast problem in optical technology," Proc. SPIE 1846, Phase Contrast and Differential Interference Contrast Imaging Techniques and Applications, (3 May 1994); https://doi.org/10.1117/12.171883