Carrier dynamics in solid C60

Naomi J. Halas

doi:10.1117/12.147124

17 June 1993 Carrier dynamics in solid C60

Naomi J. Halas

Author Affiliations +

Proceedings Volume 1861, Ultrafast Pulse Generation and Spectroscopy; (1993) https://doi.org/10.1117/12.147124
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States

Abstract

The time dependence of the carrier relaxation in undoped solid C₆₀ thin films has been studied by monitoring changes in the optical transmission upon photoexcitation at the HOMO- LUMO band edge. The relaxation closely follows a Kohlrausch-Williams-Watts decay with an exponent of (beta) equals 0.4. This functional form is typical of carrier relaxation associated with states of localized rather than extended character. Observation of this decay is highly dependent on film purity, which in turn is highly dependent on the methods used in the fullerene purification and separation processes. The effects of fullerene processing procedures on the observed carrier dynamics in solid C₆₀ is discussed.

Citation Download Citation

Naomi J. Halas "Carrier dynamics in solid C60", Proc. SPIE 1861, Ultrafast Pulse Generation and Spectroscopy, (17 June 1993); https://doi.org/10.1117/12.147124

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE