Phase-conjugate interferometers for testing optical surface

G. Notni

doi:10.1117/12.2308801

23 July 1993 Phase-conjugate interferometers for testing optical surface

G. Notni

Author Affiliations +

Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983AM (1993) https://doi.org/10.1117/12.2308801
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary

Abstract

A new method of detection and characterisation of microdefects on smooth optical surfaces is introduced. The method is based on a spatially resolved histogram analysis of pictures taken with a Differential Interference Contrast microscope (DIC).

Citation Download Citation

G. Notni "Phase-conjugate interferometers for testing optical surface", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983AM (23 July 1993); https://doi.org/10.1117/12.2308801

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