Reliability consideration for AlGaInP laser diodes by automatic power control aging simulation

Kentaro Tada; Hitoshi Hotta; Kunihiro Hara; Fumito Miyasaka; Kenichi Kobayashi; Kenji Endo

doi:10.1117/12.172747

1 June 1994 Reliability consideration for AlGaInP laser diodes by automatic power control aging simulation

Kentaro Tada, Hitoshi Hotta, Kunihiro Hara, Fumito Miyasaka, Kenichi Kobayashi, Kenji Endo

Proceedings Volume 2115, Visible and UV Lasers; (1994) https://doi.org/10.1117/12.172747
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

We develop an automatic power control aging simulation method for AlGaInP visible light emission laser diodes and apply it to aging tests of 650 nm wavelength AlGaInP lasers. A laser degradation expression, on which the simulation is based, is derived from automatic current control tests for 680 nm lasers. The simulation results agree well with the experimental results. The simulation is then used to show laser reliability (operation lifetime) as a function of laser initial characteristics (threshold current, characteristic temperature and the maximum cw temperature).

Citation Download Citation

Kentaro Tada, Hitoshi Hotta, Kunihiro Hara, Fumito Miyasaka, Kenichi Kobayashi, and Kenji Endo "Reliability consideration for AlGaInP laser diodes by automatic power control aging simulation", Proc. SPIE 2115, Visible and UV Lasers, (1 June 1994); https://doi.org/10.1117/12.172747

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