Paper
25 August 1994 Microstructural and optical characteristics of waveguiding piezoelectric zinc oxide films
V. M. Shevtsov, A. Y. Agapov, P. M. Zhitkov
Author Affiliations +
Proceedings Volume 2212, Linear and Nonlinear Integrated Optics; (1994) https://doi.org/10.1117/12.185162
Event: Integrated Optoelectronics '94, 1994, Lindau, Germany
Abstract
Optical and microstructural characteristics of polycrystalline waveguiding ZnO films deposited by RF reactive sputtering has been investigated. The origin of high waveguiding mode propagation losses and spatial inhomogeneity of the sputtered films has been investigated experimentally. A technique allowing to avoid these disadvantages has been proposed. Using this technique free of mechanical stress highly oriented textured ZnO waveguiding films with optical propagation loss less than 1 dB/cm have been deposited.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. M. Shevtsov, A. Y. Agapov, and P. M. Zhitkov "Microstructural and optical characteristics of waveguiding piezoelectric zinc oxide films", Proc. SPIE 2212, Linear and Nonlinear Integrated Optics, (25 August 1994); https://doi.org/10.1117/12.185162
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KEYWORDS
Zinc oxide

Crystals

Waveguides

Sputter deposition

X-rays

Light wave propagation

Refractive index

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