Atomic-force microscope images of silica carbogel

Bruno Chevalier; Jean-Luc Chevalier; A. Borne; Frederic Chollet; Andreas Gombert; E. Elaloui

doi:10.1117/12.185431

9 September 1994 Atomic force microscope images of silica carbogel

Bruno Chevalier, Jean-Luc Chevalier, A. Borne, Frederic Chollet, Andreas Gombert, E. Elaloui

Proceedings Volume 2255, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII; (1994) https://doi.org/10.1117/12.185431
Event: Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII, 1994, Freiburg, Germany

Abstract

The unique property of silica aerogel, to be transparent with a low thermal conductivity and the safety of the CO₂ producing mode, provides the motivation for European Laboratories to work together in the field of transparent insulation materials under the framework of European projects (Joule II, Human Capital and Mobility). A couple of problems have to be solved to achieve the goal of manufacturing a double glazing filled with monolithic carbogel. To improve the mechanical and optical properties of carbogel for its application in double glazing, one has to know the relationship between the structure and the physical properties of the carbogel. Therefore, one has to analyze the structure of carbogel in a detailed manner. This paper discusses the change in particle size as a function of the polyethoxydisoloxane precursor to water ration. We present Tapping Mode and Contact Mode atomic Force Microscope Images of carbogel which supply 3D information about the carbogel surface. The measured images provide information about the particle's size in three dimensions in nanometer scale range.

Citation Download Citation

Bruno Chevalier, Jean-Luc Chevalier, A. Borne, Frederic Chollet, Andreas Gombert, and E. Elaloui "Atomic force microscope images of silica carbogel", Proc. SPIE 2255, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIII, (9 September 1994); https://doi.org/10.1117/12.185431

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KEYWORDS

Particles

Silica

Atomic force microscope

Rayleigh scattering

Scattering

3D image processing

Microscopes

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