Contour analysis algorithms for high-speed inspection

Knut Kille

doi:10.1117/12.189086

13 October 1994 Contour analysis algorithms for high-speed inspection

Knut Kille

Proceedings Volume 2354, Intelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision; (1994) https://doi.org/10.1117/12.189086
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States

Abstract

The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithms. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g., scale-space analysis) are presented. The performance of different approaches is shown by several industrial examples and applications.

Citation Download Citation

Knut Kille "Contour analysis algorithms for high-speed inspection", Proc. SPIE 2354, Intelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision, (13 October 1994); https://doi.org/10.1117/12.189086

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