Paper
27 March 1995 Pipelined implementation of binary skeletonization using finite-state machines
Ahti A. Hujanen, Frederick M. Waltz
Author Affiliations +
Proceedings Volume 2423, Machine Vision Applications in Industrial Inspection III; (1995) https://doi.org/10.1117/12.205505
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States
Abstract
Skeletonization of binary images is an essential step in the inspection of many products, most notably printed circuit boards. It also is used in many other situations, an unusual example being the location of branching points on growing plants for purposes of cutting and vegetative propagation. Commercially-available image processing boards typically can't perform this operation, although they readily perform the easier task of repeated binary erosion. While a single skeletonization step cannot be done in one pass using a 3 X 3 neighborhood, one pass with a 4 X 4 neighborhood suffices. This result has been implemented in custom integrated circuits imbedded in proprietary products, but (to our knowledge) is not commercially available. This paper describes a new pipelined implementation of binary skeletonization which fits easily into the standard SKIPSM (Separated-Kernel Image Processing using finite State Machines) architecture and which can be built using standard ICs costing less than $DOL200 total. The same approach also can be implemented in software, providing an order-of-magnitude increase in speed at no extra cost. Furthermore, this same SKIPSM architecture is highly versatile and programmable, allowing it to be software- reconfigured to perform hundreds of other pipelined image processing operations.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ahti A. Hujanen and Frederick M. Waltz "Pipelined implementation of binary skeletonization using finite-state machines", Proc. SPIE 2423, Machine Vision Applications in Industrial Inspection III, (27 March 1995); https://doi.org/10.1117/12.205505
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Cited by 13 scholarly publications.
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KEYWORDS
Binary data

Image processing

Inspection

Algorithm development

Selenium

Computer architecture

Integrated circuits

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