Paper
3 November 1995 Laser-power measurement technique using the relationship between intensities of photoluminescence bands
V. Ya. Degoda, A. A. Artamonova, V. E. Rodionov
Author Affiliations +
Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226202
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
We experimentally established that the dependence of ratio between luminescence intensities of two centers on excitation power was determined by, besides the concentrations of these centers, the inverse ratio of their radiative lifetimes. This effect can be used to measure a power of laser excitation by relationship of luminescence intensities, corresponding to two centers with different radiative lifetime. We propose the kinetic model to explain the various relationships between luminescence intensity and excitation power (such as linear, superlinear, and sublinear). These relationships are plotted for a material with two radiative centers and a nonradiative one.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. Ya. Degoda, A. A. Artamonova, and V. E. Rodionov "Laser-power measurement technique using the relationship between intensities of photoluminescence bands", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226202
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KEYWORDS
Luminescence

Sensors

Diffusion

Absorption

Crystals

Nitrogen lasers

Semiconductor lasers

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