Paper
16 July 1981 System-Level Performance Testing Of Image-Intensified X-Ray Equipment
James A. Mulvaney, Raymond P. Rossi, James T. Spicka
Author Affiliations +
Proceedings Volume 0273, Application of Optical Instrumentation in Medicine IX; (1981) https://doi.org/10.1117/12.931798
Event: Application of Optical Instrumentation in Medicine, 1981, San Francisco, United States
Abstract
An evaluation of phantom materials is presented based on attenuation coefficients and measurements of phantom transmission using an image-intensifier system. Thicknesses of acrylic and copper that are equivalent to various anatomical regions are presented along with a copper phantom that simulates the attenuation of several anatomical regions at specific kVp's. Tests for system-level performance of image intensifiers that make use of this phantom are briefly described.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James A. Mulvaney, Raymond P. Rossi, and James T. Spicka "System-Level Performance Testing Of Image-Intensified X-Ray Equipment", Proc. SPIE 0273, Application of Optical Instrumentation in Medicine IX, (16 July 1981); https://doi.org/10.1117/12.931798
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KEYWORDS
Copper

Signal attenuation

Aluminum

Metals

X-rays

Image intensifiers

Abdomen

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