Probe-beam scanning method for beam-coupling monitoring in photorefractive crystals

A. Garcia-Weidner; A. V. Khomenko; Diana Tentori-Santa-Cruz

doi:10.1117/12.231044

5 February 1996 Probe-beam scanning method for beam-coupling monitoring in photorefractive crystals

A. Garcia-Weidner, A. V. Khomenko, Diana Tentori-Santa-Cruz

Author Affiliations +

Proceedings Volume 2730, Second Iberoamerican Meeting on Optics; (1996) https://doi.org/10.1117/12.231044
Event: Second Iberoamerican Meeting on Optics, 1995, Guanajuato, Mexico

Abstract

We describe a technique for investigation of beam coupling in photorefractive materials. We used a probe beam which partly erases the recorded hologram in a small region of the crystal. This erasure changes the coupling between the beams, then the output intensities of these beams are changed. We show by numerical simulations that these changes give us information about coupling coefficient along the length of the photorefractive sample. We compare the numerical results with experimental data of two-beam coupling in an optical active BTO waveguide-like crystal.

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A. Garcia-Weidner, A. V. Khomenko, and Diana Tentori-Santa-Cruz "Probe-beam scanning method for beam-coupling monitoring in photorefractive crystals", Proc. SPIE 2730, Second Iberoamerican Meeting on Optics, (5 February 1996); https://doi.org/10.1117/12.231044

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