Experimental measurement of the variation in sensitivity within a single pixel of a CCD

Daniel Kavaldjiev; Zoran Ninkov

doi:10.1117/12.275189

25 April 1997 Experimental measurement of the variation in sensitivity within a single pixel of a CCD

Daniel Kavaldjiev, Zoran Ninkov

Author Affiliations +

Proceedings Volume 3019, Solid State Sensor Arrays: Development and Applications; (1997) https://doi.org/10.1117/12.275189
Event: Electronic Imaging '97, 1997, San Jose, CA, United States

Abstract

The sensitivity of a solid state detector array varies as a result of changes in transmission, diffusion effects and scattering. This variation will occur on a scale length less than that of a single pixel and its knowledge is of importance for improved device design and in applications such as event centroiding in photon counting systems. This paper reports on a measurement of sensitivity variation on a sub-pixel scale for a two-phase front-illuminated CCD. The measurement was made using a scanning reflection microscope. Variation in sensitivity between the phases within a pixel and on much smaller spatial scale are clearly observed as well as crosstalk.

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Daniel Kavaldjiev and Zoran Ninkov "Experimental measurement of the variation in sensitivity within a single pixel of a CCD", Proc. SPIE 3019, Solid State Sensor Arrays: Development and Applications, (25 April 1997); https://doi.org/10.1117/12.275189

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