Paper
20 April 1998 Perfluorinated polymer films with extraordinary UV-laser damage resistance
Semyon Papernov, D. Zaksas, Ansgar W. Schmid
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Abstract
UV damage thresholds are reported together with other optical characterization results for perfluorinated, frame-supported, micron-thickness polymer membranes. These thresholds are among the highest for any material ever measured in the UV. Transmitted wavefront uniformity for pellicles up to 30 cm in clear aperture approaches the wavefront-error-detection limits of state-of-the-art interferometers. Owing to benign fabrication procedures, these foils are highly defect free and lack the birefringence characteristics typical of extruded polymers.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Semyon Papernov, D. Zaksas, and Ansgar W. Schmid "Perfluorinated polymer films with extraordinary UV-laser damage resistance", Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); https://doi.org/10.1117/12.307017
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KEYWORDS
Polymers

Polymer thin films

Resistance

Ultraviolet radiation

Birefringence

Interferometers

Laser damage threshold

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