Device reliability issues in field emission displays

Babu Chalamala; Robert H. Reuss; Troy A. Trottier; Cecil W. Penn; Yi Wei

doi:10.1117/12.321806

14 September 1998 Device reliability issues in field emission displays

Babu Chalamala, Robert H. Reuss, Troy A. Trottier, Cecil W. Penn, Yi Wei

Author Affiliations +

Proceedings Volume 3363, Cockpit Displays V: Displays for Defense Applications; (1998) https://doi.org/10.1117/12.321806
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

Field emission displays are currently making the transition from R&D into prototypes and early production. Device reliability is a critical issue in realization of successful field emission displays that are able to compete with other established technologies like active matrix liquid crystal displays and thin film electroluminescent displays. In this paper, we review the fundamental issues affecting the reliability and operational life of field emission display systems.

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Babu Chalamala, Robert H. Reuss, Troy A. Trottier, Cecil W. Penn, and Yi Wei "Device reliability issues in field emission displays", Proc. SPIE 3363, Cockpit Displays V: Displays for Defense Applications, (14 September 1998); https://doi.org/10.1117/12.321806

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