Optical Degradation Due To Contamination On The SAGE/SAGE Ll Spaceflight Instruments

L. E. Mauldin III; W. P. Chu

doi:10.1117/12.933638

12 April 1983 Optical Degradation Due To Contamination On The SAGE/SAGE Ll Spaceflight Instruments

L. E. Mauldin III, W. P. Chu

Proceedings Volume 0338, Spacecraft Contamination Environment; (1983) https://doi.org/10.1117/12.933638
Event: 1982 Technical Symposium East, 1982, Arlington, United States

Abstract

An optical model for contamination effects has been developed for the SAGEII/ERBS instru-ment. This model describes instrument throughput efficiency and response characteristics as a function of molecular contamination thickness for indexes of refraction representative of Shuttle/ERBS/SAGE II contaminants at seven spectral wavelengths between 0.385 and 1.02 micrometers. Contamination effects are treated as thin film coatings on selected optical elements which cause changes in those elements reflection/transmission/absorption characteristics. SAGE/AEM in-orbit performance data were used to estimate the optical constants for the contaminants. SAGE and SAGE II are radiometers that spatially scan the sun through the Earth's atmosphere with a narrow field-of-view in spectral intervals from visible to the near infrared.

Citation Download Citation

L. E. Mauldin III and W. P. Chu "Optical Degradation Due To Contamination On The SAGE/SAGE Ll Spaceflight Instruments", Proc. SPIE 0338, Spacecraft Contamination Environment, (12 April 1983); https://doi.org/10.1117/12.933638

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