Paper
30 October 1998 Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces
Elena I. Chaikina, Pedro Negrete-Regagnon, Gabriel C. Martinez-Niconoff, Eugenio R. Mendez
Author Affiliations +
Abstract
An experimental investigation of the hemispherical distribution of the light scattered by randomly rough isotropic dielectric surfaces is presented. The surfaces, whose profiles constitute good approximations to Gaussian random processes with Gaussian correlation functions are fabricated in photoresist. The substrates employed in the fabrication of the samples consist of thick parallel plates of filter glass that absorb the incident light and whose refractive index is close to that of photoresist. This allows us to approximate experimentally a situation in which the light is scattered by a randomly rough interface separating two semi-infinite dielectric media. The results display features that can be attributed to multiple scattering. In particular, a well-defined enhanced backscattering peak is observed in both, the co- and cross-polarized scattering measurements.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elena I. Chaikina, Pedro Negrete-Regagnon, Gabriel C. Martinez-Niconoff, and Eugenio R. Mendez "Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); https://doi.org/10.1117/12.328449
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KEYWORDS
Light scattering

Scattering

Dielectrics

Interfaces

Photoresist materials

Dielectric polarization

Backscatter

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