Paper
7 May 1999 Wavelength scanning confocal interference microscope for separate measurement of refractive index and geometrical thickness
Takashi Fukano, Ichirou Yamaguchi
Author Affiliations +
Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347819
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
Abstract
We previously proposed a system based on a combination of a confocal microscope and a wavelength scanning heterodyne interferometer, for separate measurement of refractive index and geometrical thickness of lens and plates. However, we used two optical systems successively although they share the same optical system. In this paper, we propose a new measurement scheme which enable us to measure both the confocal profile and the optical path difference of the interferometer by single scanning of an object. We describe herE the measurement principle, the apparatus, signal processing means, and some experimental results.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takashi Fukano and Ichirou Yamaguchi "Wavelength scanning confocal interference microscope for separate measurement of refractive index and geometrical thickness", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); https://doi.org/10.1117/12.347819
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Confocal microscopy

Refractive index

Microscopes

Interferometers

Signal detection

Heterodyning

Mirrors

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